Roschuk, T.; Wilson, P. R. J.; Li, J.; Zalloum, O. H. Y.; Wojcik, J.; Mascher, P.
(Wiley-VCH, 2009-12-15)
The X-ray absorption near edge structure (XANES) and X-ray
excited optical luminescence (XEOL) of a set of photoluminescent rare earth (RE) (Tb, Ce) doped silicon oxide
(SiOx) thin films, having compositions ranging from ...