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Photoluminescence and positron annihilation spectroscopy of MeV Si+ ion-irradiated Si𝑦�O1−𝑦�:Er (𝑦�≈1/3) thin films

Blakie, D. E.; Zalloum, O. H. Y.; Wojcik, J.; Irving, E. A.; Knights, A. P.; Mascher, P.; Simpson, P. J. (Publisher Journal of Applied Physics, 2009-03-12)

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- Blakie, D. E. (1)
- Irving, E. A. (1)
- Knights, A. P. (1)
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