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Browsing by Subject "Mobile , Based , Digital , IC , Tester"

Browsing by Subject "Mobile , Based , Digital , IC , Tester"

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  • Taweel, Amany; Mujahed, Sundos (Palestine Polytechnic University - Department of Computer science, 6/1/2017)
    Abstract The Integrated Circuits (ICs) logic gates are widely used in the electronic circuits. Different values and types from different families are needed to design a circuit for practical operations. To get the proper ...

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